SHIN, T.-K.; KIM, J. Design is Everywhere, But Nowhere in Patent Analytics. Cubic Journal, [S. l.], v. 6, n. 6, p. 20–33, 2023. DOI: 10.31182/cubic.2023.6.58. Disponível em: https://cubicjournal.org/index.php/cubic/article/view/68. Acesso em: 26 feb. 2024.